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Comprehensive Hot Electron Assessment of Ku-Band AlGaAs/GaAs Power HFETs: Electrical Characterization, Accelerated Stress, and Simulation

著者名:
Dieci, D. ( University of Modena and Reggio Emilia, Italy )
Tomasi, T ( University of Modena and Reggio Emilia, Italy )
Canali, C. ( University of Modena and Reggio Emilia, Italy )
Menozzi, R. ( University of Parma, Italy )
Sozzi, G. ( University of Parma, Italy )
Lanzieri, C. ( Alenia, Italy )
さらに 1 件
掲載資料名:
Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands
シリーズ名:
ESA SP
シリーズ巻号:
439
発行年:
2000
開始ページ:
205
終了ページ:
210
総ページ数:
6
出版情報:
Noordwijk, The Netherlands: ESA Publications Division
ISSN:
03796566
ISBN:
9789290927563 [9290927569]
言語:
英語
請求記号:
E11690/439
資料種別:
国際会議録

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