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Effect of Charge Distribution on Burnout Threshold of Hardened Power MOSFET

著者名:
Salame, C. ( Universifte de Perpignan, France )
Pelanchon, F. ( Universifte de Perpignan, France )
Mialhe, P. ( Universifte de Perpignan, France )
Hoffmann, A. ( Supelec France )
Charles, J.-P. ( Supelec France )
Kerns, S. ( Franklin W. Olin College of Engineering, USA )
Kerns, D.V. ( Franklin W. Olin College of Engineering, USA )
Adams, L. ( Brunel University, United Kingdom )
さらに 3 件
掲載資料名:
Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands
シリーズ名:
ESA SP
シリーズ巻号:
439
発行年:
2000
開始ページ:
25
終了ページ:
30
総ページ数:
6
出版情報:
Noordwijk, The Netherlands: ESA Publications Division
ISSN:
03796566
ISBN:
9789290927563 [9290927569]
言語:
英語
請求記号:
E11690/439
資料種別:
国際会議録

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