Blank Cover Image

Microstructural Parameter-Based Characterization of Annealing Behaviour in Metals Deformed to High Strains

著者名:
掲載資料名:
Recrystallization and grain growth : SF2M : proceedings of the second Joint International Conference on Recrystallization and Grain Growth, ReX & GG2, SF2M, held in Annecy, France, 30th August - 3rd September 2004
シリーズ名:
Materials science forum
シリーズ巻号:
467-470
発行年:
2004
開始ページ:
387
終了ページ:
392
総ページ数:
6
出版情報:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499526 [0878499520]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

J. Shi, W.Q. Cao, H. Dong

Trans Tech Publications

Cao, W.Q., Liu, Q., Godfrey, A., Hansen, N.

Trans Tech Publications

C.H.J. Davies, W.Q. Cao, C.F. Gu, R.Y. Lapovok, E.V. Pereloma

Trans Tech Publications

Li, X. L., Liu, W., Godfrey, A., Liu, Q.

Trans Tech Publications

Godfrey, A., Wu, G.L., Liu, Q.

Trans Tech Publications

Cao,N., Liu,W.Q.

SPIE - The International Society for Optical Engineering

H. Y. Li, Y. Liu, Q. Cao

Society of Photo-optical Instrumentation Engineers

Godfrey, A., Liu, W., Lin, D., Liu, Q.

Trans Tech Publications

Y.T. Wang, W.Q. Hu, Z.D. Liu

Trans Tech Publications

R.K. Pan, Y. Li, F. Fang, W.Q. Cao, Y.B. He

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12