Thermal Characterisation of AlGaN/GaN HEMTs using Micro-Raman Scattering Spectroscopy and Pulsed I-V Measurements
- 著者名:
Aubry, R. Jacquet, J.C. Dua, C. Gerard, H. Dessertenne, B. di Forte-Poisson, M.A. Cordier, Y. Delage, S.L. - 掲載資料名:
- Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 457-460
- 発行年:
- 2004
- 開始ページ:
- 1625
- 終了ページ:
- 1628
- 総ページ数:
- 4
- 出版情報:
- Uetikon-Zuerich: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878499434 [0878499431]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
LP-MOCVD Growth of GaAlN/GaN Heterostructures on Silicon Carbide: Application to HEMT's Devices
Materials Research Society |
Materials Research Society |
MRS-Materials Research Society | |
Electrochemical Society |
Materials Research Society |
4
国際会議録
Thermal analysis of AlGaN/GaN HFETs using electro-thermal simulation and micro-Raman spectroscopy
SPIE - The International Society of Optical Engineering |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
Trans Tech Publications |
6
国際会議録
Measurement of Local Temperatures Using (micro)-Raman of SiC and AlGaN-GaN/SiC Power and RF Devices
Trans Tech Publications |
12
国際会議録
Determination of AlGaN/GaN HEMT Reliability Using Optical Pumping as a Characterization Method
Materials Research Society |