Blank Cover Image

The Strain Measurement in Spot Welded Joints Using the ESPI Method

著者名:
掲載資料名:
Advanced materials processing II : proceedings of the 2nd International Conference on Advanced Materials Processing, Grand Hyatt, Singapore, 2nd-4th December 2002
シリーズ名:
Materials science forum
シリーズ巻号:
437-438
発行年:
2003
開始ページ:
463
終了ページ:
466
総ページ数:
4
出版情報:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499212 [0878499210]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

K.S. Bang, W.Y. Kim, C. Park, Y.H. Ahn, J.B. Lee

Trans Tech Publications

Jeon,J.G., Kim,Y.H., Park,G.M., Park,K.T.

SPIE-The International Society for Optical Engineering

2 国際会議録 Why Debonding is Useful in SOI

Cha, G., Lee, S.H., Park, H.J., Lee, K.H., Kang, H.S., Song, C.S., Kim, D.J., Kim, Y.C., Kim, S.K.

Electrochemical Society

C.G. Kang, J.S. Kim, H.K. Jin, B.Y. Lee, S.Y. Lee

Trans Tech Publications

Jeong, C.-Y., Lim, Y.H., Kim, H.I., Park, J.L., Choi, J.S., Lee, J.G.

SPIE - The International Society of Optical Engineering

Kim,Y.H., Lee,K.W., Jeon,J.G., Park,K.T., Suh,I.S., Nam,B.D.

SPIE-The International Society for Optical Engineering

Kim,S.Y., Lee,H.G., Won,Y.H.

SPIE-The International Society for Optical Engineering

K.H. Chang, H.C. Park, C.H. Lee, G.C. Jang, S.H. Lee

Trans Tech Publications

Choi, Y.-H., Park, J.R., Sung, M.-G., Yang, S.-H., Kim, S.-H., Lee, H.-J., Lee, J.-Y., Jang, I.Y., Kim, Y.H., Choi, …

SPIE-The International Society for Optical Engineering

Sung, K.H., Park, B.W., Kim, J.I., Kim, J.J., Bae, H.K., Park, Y.H., Hur, C.W.

Materials Research Society

S. J. Kim, Y. J. Kang, D. P. Hong, K. S. Kim, N. K. Park

Society of Photo-optical Instrumentation Engineers

Yang, H.J., Lee, J.G., Cho, B.S., Lee, J.H., Jeong, C.O., Chung, K.H.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12