Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation

Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation

著者名:

掲載資料名:

ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002

シリーズ名:

Materials science forum

シリーズ巻号:

404-407

発行年:

2002

開始ページ:

293

終了ページ:

298

総ページ数:

6

出版情報:

Uetikon-Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499007 [0878499008]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013337
シリーズID:	PA00000012
会議名:	European Conference on Residual Stresses - ECRS
回次:	6th
会議開催地:	Coimbra, Portugal
会議開催年:	2002.07.10-2002.07.12

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