Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

著者名:

Persson, P.O.A.

Jacobson, H.

Molina-Aldareguia, J.M.

掲載資料名:

Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001

シリーズ名:

Materials science forum

シリーズ巻号:

389-393

発行年:

2002

開始ページ:

423

終了ページ:

426

総ページ数:

4

出版情報:

Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878498949 [087849894X]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013330
シリーズID:	PA00000012
会議名:	International Conference on Silicon Carbide and Related Materials
回次:	2001
会議開催地:	Tsukuba, Japan
会議開催年:	2001.10.28-2001.11.02

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1 国際会議録 Structural Defects in Electrically Degraded 4H-SiC PiN Diodes Persson, P.O.A., Jacobson, H., Molina-Aldareguia, J.M., Bergman, J.P., Tuomi, T., Clegg, W.J., Janzen, E., Hultman, L. Trans Tech Publications	7 国際会議録 Structural Defects in Ion Implanted 4H-SiC Epilayers Persson, P.O.Å., Skorupa, W., Panknin, D., Kuznetsov, A., Hallen, A., Hultman, L. Materials Research Society
2 国際会議録 Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes Jacobson, H., Bergman, J.P., Hallin, C., Tuomi, T., Janzen, E. Trans Tech Publications	8 国際会議録 Proton Irradiation Induced Defects in 4H-SiC Storasta, L., Carlsson, F.H.C., Sridhara, S.G., Aberg, D., Bergman, J.P., Hallen, A., Janzen, E. Trans Tech Publications
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4 国際会議録 Two Dimensional X-Ray Diffraction Mapping of Basal Plane Orientation on SiC Substrates J. Palisaitis, J.P. Bergman, P.O.Å. Persson Trans Tech Publications	10 国際会議録 Implementation of Hot-Wall MOCVD to the Growth of High-Quality GaN on SiC Kakanakova-Georgieva, A., Forsberg, U., Hallin, C., Persson, P.O.A., Storasta, L., Pozina, G., Birch, J., Hultman, L., … Trans Tech Publications
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