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Interface Defects of Al/GaAs(100) Detected by Positron Annihilation Induced Auger Electron Spectroscopy (PAES)

著者名:
掲載資料名:
Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany
シリーズ名:
Materials science forum
シリーズ巻号:
363-365
発行年:
2001
開始ページ:
621
終了ページ:
623
総ページ数:
3
出版情報:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498758 [0878498753]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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