High Resolution Polymer Microscopy at GE's Global Research Center
- 著者名:
Teetsov, J.A. ( General Electric Global Research Center ) Denault, L. ( General Electric Global Research Center ) Alizadeh, A. ( General Electric Global Research Center ) Ghanti, S. ( General Electric Global Research Center ) Cicha, W. ( General Electric Global Research Center ) Hall, E. ( General Electric Global Research Center ) - 掲載資料名:
- ANTEC 2004, 62nd annual technical conference, Chicago, IL, May 16-20, 2004
- シリーズ名:
- Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
- シリーズ巻号:
- 62
- 発行年:
- 2004
- 開始ページ:
- 2357
- 終了ページ:
- 2359
- 総ページ数:
- 3
- 出版情報:
- Brookfield Center, Conn.: Society of Plastics Engineers
- ISBN:
- 9780975370704 [0975370707]
- 言語:
- 英語
- 請求記号:
- S42700/62-2
- 資料種別:
- 国際会議録
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Transverse priority scanning and microscopy for high-resolution optical coherence tomography
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