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Study on microdisplacement measurement by laser interference and image processing methods

著者名:
Zheng, L. ( Tsinghua Univ. (China) )
Wang, J.
Kong, X.
Chen, D.
Liu, Z. ( National Institute of Metrology (China) )
Qian, J.
Li, Y.
さらに 2 件
掲載資料名:
Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5253
発行年:
2003
開始ページ:
366
終了ページ:
371
総ページ数:
6
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819451378 [0819451371]
言語:
英語
請求記号:
P63600/5253
資料種別:
国際会議録

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