Shape measurement of BGA for analysis of defects by x-ray imaging

Shape measurement of BGA for analysis of defects by x-ray imaging

著者名:

Sumitomo, T. ( Okayama Univ. Medical School (Japan) )

Maruyama, T.

Azuma, Y.

Goto, S.

Mondou, M. ( Eastern Hiroshima Prefecture Industrial Research Institute (Japan) )

Furukawa, N. ( National Institute of Advanced Industrial Science and Technology (Japan) )

Okada, S.

さらに 2 件

掲載資料名:

Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5253

発行年:

2003

開始ページ:

361

終了ページ:

365

総ページ数:

5

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819451378 [0819451371]

言語:

英語

請求記号:

P63600/5253

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013169
シリーズID:	PA00000029
会議名:	International Symposium on Instrumentation and Control Technology
回次:	2003 : 5th
会議開催地:	Beijing, China
会議開催年:	2003.10.24-2003.10.27

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