The prediction of lifetime failure of thermal barrier coatings using piezospectroscopic techniques

The prediction of lifetime failure of thermal barrier coatings using piezospectroscopic techniques

著者名:

Chunnilall, C. J. ( National Physical Lab. (United Kingdom) )
Banks, J. P.
Chen, G. F.
Cheung, J. Y.
Saunders, S. R. J.

掲載資料名:

Optical diagnostic methods for inorganic materials III : 6-7 August 2003, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5192

発行年:

2003

開始ページ:

168

終了ページ:

178

総ページ数:

11

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819450654 [0819450650]

言語:

英語

請求記号:

P63600/5192

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013153
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optical Diagnostic Methods for Inorganic Materials
回次:	2003 : 3rd
会議開催地:	San Diego, CA, USA
会議開催年:	2003.08.06-2003.08.07

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