Recent work at NML to establish traceability for survey electronic distance measurement (EDM)

Recent work at NML to establish traceability for survey electronic distance measurement (EDM)

著者名:

Brown, N. ( CSIRO (Australia) )
Veugen, R. ( Technische Univ. Eindhoven (Netherlands) )
van der Beek, G.-J.
Hugers, R. F. H.

掲載資料名:

Recent Developments in Traceable Dimensional Measurements II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5190

発行年:

2003

開始ページ:

381

終了ページ:

390

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819450630 [0819450634]

言語:

英語

請求記号:

P63600/5190

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013151
シリーズID:	PA00000029
会議名:	Optics & Photonics : Recent Developments in Traceable Dimensional Measurements
回次:	2003 : 2nd
会議開催地:	San Diego, CA, USA
会議開催年:	2003.08.04-2003.08.06

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