Restoring aperture profile at sample plane

Restoring aperture profile at sample plane

著者名:

Jackson, J.L. ( Lawrence Livermore National Lab. (USA) )
Hackel, R.P. ( Lawrence Livermore National Lab. (USA) )
Lungershausen, A.W. ( Ultratech Stepper, Inc. (USA) )

掲載資料名:

Laser Beam Shaping IV

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5175

発行年:

2003

開始ページ:

66

終了ページ:

76

総ページ数:

11

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819450487 [0819450480]

言語:

英語

請求記号:

P63600/5175

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013145
シリーズID:	PA00000029
会議名:	Optics & Photonics : Laser beam shaping
回次:	2003 : 4th
会議開催地:	San Diego, CA, USA
会議開催年:	2003.08.06-2003.08.07

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