Microscopic investigation of large-signal noise in semiconductor materials and devices (Invited Paper)
- 著者名:
Gonzalez, T. ( Univ. de Salamanca (Spain) ) Perez, S. ( Univ. de Salamanca (Spain) ) Starikov, E. ( Semiconductor Physics Institute (Lithuania) ) Shiktorov, P. ( Semiconductor Physics Institute (Lithuania) ) Gruzinskis, V. ( Semiconductor Physics Institute (Lithuania) ) Reggiani, L. ( INFM (Italy) ) Varani, L. ( Univ. Montpellier II (France) ) Vaissiere, J.C. ( Univ. Montpellier II (France) ) - 掲載資料名:
- Noise in Devices and Circuits
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5113
- 発行年:
- 2003
- 開始ページ:
- 252
- 終了ページ:
- 266
- 総ページ数:
- 15
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449733 [0819449733]
- 言語:
- 英語
- 請求記号:
- P63600/5113
- 資料種別:
- 国際会議録
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