An overview of low-frequency noise in advanced CMOS/SOI transistors (Invited Paper)

An overview of low-frequency noise in advanced CMOS/SOI transistors (Invited Paper)

著者名:

Jomaah, J. ( Ecole Nationale Superieure d'Electronique et de Radioelectricite de Grenoble (France) )
Balestra, F. ( Ecole Nationale Superieure d'Electronique et de Radioelectricite de Grenoble (France) )

掲載資料名:

Noise in Devices and Circuits

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5113

発行年:

2003

開始ページ:

159

終了ページ:

167

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449733 [0819449733]

言語:

英語

請求記号:

P63600/5113

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013101
シリーズID:	PA00000029
会議名:	International Symposium on Fluctuations and Noise : Noise in Devices and Circuits
回次:	2003
会議開催地:	Santa Fe, NM, USA
会議開催年:	2003.06.02-2003.06.04

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2 国際会議録 Low frequency noise sources in fully and partially depleted SOI MOSFETs from room to liquid helium temperatures Jomaah, J, Ghibaudo, G, Balestra, F Electrochemical Society	8 国際会議録 Low-frequency noise and fluctuations in advanced CMOS devices (Invited Paper) Ghibaudo, G. SPIE-The International Society for Optical Engineering
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