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Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)

著者名:
Dambrine, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Raynaud, C. ( STMicroelectronics (France) )
Vanmackelberg, M. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Danneville, F. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Pailloncy, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Lepilliet, S. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Raskin, J.P. ( Univ. Catholique de Louvain (Belgium) )
さらに 2 件
掲載資料名:
Noise in Devices and Circuits
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5113
発行年:
2003
開始ページ:
105
終了ページ:
119
総ページ数:
15
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
言語:
英語
請求記号:
P63600/5113
資料種別:
国際会議録

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