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Microstructures of defects causing noise in MOS devices (Invited Paper)

著者名:
Fleetwood, D.M. ( Vanderbilt Univ. (USA) )  
掲載資料名:
Noise as a Tool for Studying Materials
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5112
発行年:
2003
開始ページ:
259
終了ページ:
270
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449726 [0819449725]
言語:
英語
請求記号:
P63600/5112
資料種別:
国際会議録

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