Blank Cover Image

Example of deriving command and control metrics based on a knowledge analysis framework

著者名:
掲載資料名:
Battlespace digitization and network-centric systems III : 23-25 April 2003, Orlando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5101
発行年:
2003
開始ページ:
157
終了ページ:
167
総ページ数:
11
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449610 [081944961X]
言語:
英語
請求記号:
P63600/5101
資料種別:
国際会議録

類似資料:

Yue,Y., Kirby,B., Seymour,R.S.

SPIE-The International Society for Optical Engineering

M. Wen, Y.L. Yue, H.T. Zhang, Y. Li

Trans Tech Publications

Wu, H.T., Joseph, B.

American Institute of Chemical Engineers

Stytz M. R, Banks S. B

SPIE - The International Society of Optical Engineering

E. Jeschke, B. Bon, T. Inagaki, S. Streeper

Society of Photo-optical Instrumentation Engineers

Kang, M.H., Mayfield, T.

SPIE-The International Society for Optical Engineering

Luo,H., Gaborski,R.S., Acharya,R.S.

SPIE-The International Society for Optical Engineering

Bai, S., Ke, Yue, Shishkin, Y., Shigiltchoff, O., Devaty, R.P., Choyke, W.J., Strauch, D., Stojetz, B., Dorner, B., …

Materials Research Society

Luo, H., Gaborski, R.S., Acharya, R.S.

SPIE-The International Society for Optical Engineering

Charpentier,R., Demers,D., Gouin,D., McCann,C., Nourry,G., Pigeau,R., Smith,D.L., Vezina,G., Walker,R.S.

SPIE-The International Society for Optical Engineering

Hanson, S.G., Hansen, R.S., Yura, H.T.

SPIE-The International Society for Optical Engineering

Rudrapatna, M., Sowmya, A., Zrimec, T., Wilson, P., Kossoff, G., Lucas, P., Wong, J., Misra, A., Busayarat, S.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12