Development and testing of the EVS 2000 enhanced vision system

Development and testing of the EVS 2000 enhanced vision system

著者名:

Way, S.P. ( Max-Viz, Inc. (USA) )

掲載資料名:

Enhanced and synthetic vision 2003 : 21 April, 2003, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5081

発行年:

2003

開始ページ:

51

終了ページ:

57

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449405 [0819449407]

言語:

英語

請求記号:

P63600/5081

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013069
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Enhanced and synthetic vision
回次:	2003
会議開催地:	Orlando, FL, USA
会議開催年:	2003.04.21

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