Micro-electromechanically informed phenomenological constitutive models for ferroelectrics

Micro-electromechanically informed phenomenological constitutive models for ferroelectrics

著者名:

Landis, C.M. ( Rice Univ. (USA) )
Wang, J. ( Rice Univ. (USA) )
Sheng, J. ( Rice Univ. (USA) )

掲載資料名:

Smart structures and materials 2003 : Active materials : Behavior and mechanics : 3-6 March 2003, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5053

発行年:

2003

開始ページ:

335

終了ページ:

346

総ページ数:

12

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448583 [0819448583]

言語:

英語

請求記号:

P63600/5053

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013044
シリーズID:	PA00000029
会議名:	Smart Structures and Materials
回次:	2003
会議開催地:	San Diego, CA, USA
会議開催年:	2003.03.03-2003.03.06

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