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Investigation of the foaming process of metals by synchrotron radiation imaging

著者名:
Helfen, L. ( Fraunhofer-Institut fuer Zerstoerungsfreie Pruefverfahren (Germany) )
Stanzick, H. ( Fraunhofer-Institut Fertigungstechnik Materialforschung (Germany) )
Ohser, J. ( Fraunhofer-Institut fuer Techno- und Wirtschaftsmathematik (Germany) )
Schladitz, K. ( Fraunhofer-Institut fuer Techno- und Wirtschaftsmathematik (Germany) )
Rejmankova-Pernot, P. ( Fraunhofer-Institut fuer Zerstoerungsfreie Pruefverfahren (Germany) )
Banhart, J. ( Hahn-Meitner-Institut (Germany) )
Baumbach, T. ( Fraunhofer-Institut fuer Zerstoerungsfreie Pruefverfahren (Germany) )
さらに 2 件
掲載資料名:
Testing, Reliability, and Application of Micro- and Nano-Material Systems
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5045
発行年:
2003
開始ページ:
254
終了ページ:
265
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448507 [0819448508]
言語:
英語
請求記号:
P63600/5045
資料種別:
国際会議録

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