Scatterometry-based overlay metrology

Scatterometry-based overlay metrology

著者名:

Huang, H.-T. ( Therma-Wave, Inc. (USA) )

Raghavendra, G. ( Therma-Wave, Inc. (USA) )

Sezginer, A. ( Therma-Wave, Inc. (USA) )

Johnson, K. ( Therma-Wave, Inc. (USA) )

Stanke, F.E. ( Therma-Wave, Inc. (USA) )

Zimmerman, M.L. ( Therma-Wave, Inc. (USA) )

Cheung, C. ( Advanced Micro Devices, Inc. (USA) )

Miyagi, M. ( Tokyo Electron Texas (USA) )

Singh, B. ( Advanced Micro Devices, Inc. (USA) )

さらに 4 件

掲載資料名:

Metrology, Inspection, and Process Control for Microlithography XVII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5038

発行年:

2003

巻:

1

開始ページ:

126

終了ページ:

137

総ページ数:

12

出版情報:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448439 [0819448435]

言語:

英語

請求記号:

P63600/5038

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013025
シリーズID:	PA00000029
会議名:	SPIE Advanced Lithography : Metrology, Inspection, and Process Control for Microlithography
回次:	2003 : 17th
会議開催地:	Santa Clara, California, USA
会議開催年:	2003.02.24-2003.02.27
論文注記:	Overlay and Registration Metrology I ; 5038-132

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