Blank Cover Image

Assessment of a novel, high-resolution, color, AMLCD for diagnostic medical image display: luminance performance and DICOM calibration

著者名:
掲載資料名:
Medical imaging 2003 : Image perception, observer performance, and technology assessment : 18-20 February 2003, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5034
発行年:
2003
開始ページ:
359
終了ページ:
370
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819448354 [0819448354]
言語:
英語
請求記号:
P63600/5034
資料種別:
国際会議録

類似資料:

Flynn,M.J., Compton,K.D., Badano,A.

SPIE-The International Society for Optical Engineering

Badano,A., Flynn,M.J.

SPIE-The International Society for Optical Engineering

Bhangoo,S., Channin,D.S., Mongkolwat,P., Leung,N., Wu,R.

SPIE-The International Society for Optical Engineering

Kurtz, R. M., Pradhan, R. D., Aye, T. M., Chua, K. -B., Tengara, I., Tun, N., Win, T., Holmstedt, J., Schindler, A., …

SPIE - The International Society of Optical Engineering

Havig,P.R., Grigsby,S.S., Heft,E.L., LaCreta,J.M., Post,D.L.

SPIE-The International Society for Optical Engineering

Muka,E., Mertelmeier,T., Slone,R.M., Senol,E.

SPIE-The International Society for Optical Engineering

M.J. Flynn, T. McDonald, Jr., E.G. DiBello, J.L. Jorgensen, W. Worobey

Society of Photo-optical Instrumentation Engineers

Y. Tian, W. Cai, J. Sun, J. Zhang

Society of Photo-optical Instrumentation Engineers

Kenter,A.T., Chappell,J.H., Kraft,R.P., Meehan,G.R., Murray,S.S., Zombeck,M.V., Hole,K.T., Juda,M., Donnelly,R.H., …

SPIE - The International Society for Optical Engineering

Kenter,A.T., Chappell,J.H., Kobayashi,K., Kraft,R. P., Meehan,G. R., Murray,S. S., Zombeck,M. V., Fraser,G. W., …

SPIE-The International Society for Optical Engineering

Kenney,R.S., Channin,D.S., Prior,F.W.

SPIE-The International Society for Optical Engineering

Blume, H.R., Steven, P.M., Cobb, M.E., Ho, A.M., Stevens, F., Muller, S., Roehring, H., Fan, J.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12