Nanoscale materials characterization of degradation in VCSELs (Invited Paper)

Nanoscale materials characterization of degradation in VCSELs (Invited Paper)

著者名:

Mathes, D.T. ( Honeywell Inc. (USA) )

Hull, R. ( Univ. of Virginia (USA) )

Choquette, K.D. ( Univ. of Illinois/Urbana-Champaign (USA) )

Geib, K.M. ( Sandia National Labs. (USA) )

Allerman, A.A. ( Sandia National Labs. (USA) )

Guenter, J.K. ( Honeywell Inc. (USA) )

Hawkins, B. ( Honeywell Inc. (USA) )

Hawthorne, R.A. ( Honeywell Inc. (USA) )

さらに 3 件

掲載資料名:

Vertical-Cavity Surface-Emitting Lasers VII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4994

発行年:

2003

開始ページ:

67

終了ページ:

82

総ページ数:

16

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447944 [0819447943]

言語:

英語

請求記号:

P63600/4994

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012977
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Vertical-cavity surface-emitting lasers
回次:	2003 : 7th
会議開催地:	San Jose, CA, USA
会議開催年:	2003.01.29-2003.01.30

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