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Characterization of failure mechanisms for oxide VCSELs (Invited Paper)

著者名:
McHugo, S.A. ( Agilent Technologies (USA) )
Krishnan, A. ( Agilent Technologies (USA) )
Krueger, J.J. ( Agilent Technologies (USA) )
Luo, Y. ( Agilent Technologies (USA) )
Tan, N.-X. ( Agilent Technologies (USA) )
Osentowski, T. ( Agilent Technologies (USA) )
Xie, S. ( Agilent Technologies (USA) )
Mayonte, M.S. ( Agilent Technologies (USA) )
Herrick, R.W. ( Agilent Technologies (USA) )
Deng, Q. ( Agilent Technologies (USA) )
Heidecker, M. ( Agilent Technologies (USA) )
Eastley, D. ( Agilent Technologies (USA) )
Keever, M.R. ( Agilent Technologies (USA) )
Kocot, C.P. ( Agilent Technologies (USA) )
さらに 9 件
掲載資料名:
Vertical-Cavity Surface-Emitting Lasers VII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4994
発行年:
2003
開始ページ:
55
終了ページ:
66
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447944 [0819447943]
言語:
英語
請求記号:
P63600/4994
資料種別:
国際会議録

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