Characterization of failure mechanisms for oxide VCSELs (Invited Paper)
- 著者名:
McHugo, S.A. ( Agilent Technologies (USA) ) Krishnan, A. ( Agilent Technologies (USA) ) Krueger, J.J. ( Agilent Technologies (USA) ) Luo, Y. ( Agilent Technologies (USA) ) Tan, N.-X. ( Agilent Technologies (USA) ) Osentowski, T. ( Agilent Technologies (USA) ) Xie, S. ( Agilent Technologies (USA) ) Mayonte, M.S. ( Agilent Technologies (USA) ) Herrick, R.W. ( Agilent Technologies (USA) ) Deng, Q. ( Agilent Technologies (USA) ) Heidecker, M. ( Agilent Technologies (USA) ) Eastley, D. ( Agilent Technologies (USA) ) Keever, M.R. ( Agilent Technologies (USA) ) Kocot, C.P. ( Agilent Technologies (USA) ) - 掲載資料名:
- Vertical-Cavity Surface-Emitting Lasers VII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4994
- 発行年:
- 2003
- 開始ページ:
- 55
- 終了ページ:
- 66
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447944 [0819447943]
- 言語:
- 英語
- 請求記号:
- P63600/4994
- 資料種別:
- 国際会議録
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12
国際会議録
Design for Reliability and Common Failure Mechanisms in Vertical Cavity Surface Emitting Lasers
Materials Research Society |