Blank Cover Image

Improved temperature characteristics of semiconductor lasers due to carrier redistribution among nonidentical multiple quantum wells

著者名:
  • Wu, C.-H. ( National Taiwan Univ. (Taiwan) )
  • Lin, C.-F. ( National Taiwan Univ. (Taiwan) )
  • Yu, D.-K. ( National Taiwan Univ. (Taiwan) )
  • Wu, B.-R. ( Chunghua Telecom Co., Ltd. (Taiwan) )
掲載資料名:
Physics and Simulation of Optoelectronic Devices XI
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4986
発行年:
2003
開始ページ:
237
終了ページ:
244
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447869 [0819447862]
言語:
英語
請求記号:
P63600/4986
資料種別:
国際会議録

類似資料:

Lin, C.-F., Su, Y.-S., Wu, B.-R.

SPIE-The International Society for Optical Engineering

Lu,N.H., Tsai,D.P., Yeh,F.C., Chang,C.S., Tsong,T.T., Huang,M.F., Liu,C.J.

SPIE-The International Society for Optical Engineering

Su, Y.-S., Wu, C.-H., Lin, C.-F.

SPIE - The International Society of Optical Engineering

Lee,B.-L., Lin,C.-F., Chen,M.J.

SPIE - The International Society for Optical Engineering

Wu,B.-R., Lin,C.-F., Laih,L.-W., Shih,T.-T.

SPIE-The International Society for Optical Engineering

Yu,R.-C., Nagarajan,R., Bowers,J.E.

SPIE-The International Society for Optical Engineering

Yu, D.-K., Shmavonyan, G.Sh., Su, Y.-S., Lin, C.-F.

SPIE-The International Society for Optical Engineering

Feng, S.-W., Cheng, Y.-C., Chung, Y.-Y., Mao, M.-H., Yang, C.-C., Lin, Y.-S., Ma, K.-J., Chyi, J.-I

SPIE-The International Society for Optical Engineering

Hybertsen,M.S., Alam,M.A., Baraff,G.A., Smith,R.K., Shtengel,G.E., Reynolds,C.L.,Jr., Belenky,G.L.

SPIE - The International Society for Optical Engineering

Feng, S.-W., Cheng, Y.-C., Chung, Y.-Y., Liu, C.W., Mao, M.-H., Yang, C.-C., Lin, Y.-S., Ma, K.-J., Chyi, J.-I.

SPIE-The International Society for Optical Engineering

Su, Y.-S., Lin, C.-F., Yu, D.-K., Wu, B.-R.

SPIE-The International Society for Optical Engineering

Wu,B.-R., Lin,C.-F., Laih,L.-W., Shih,T.-T.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12