Real-time weld defect inspection system in x-ray images

Real-time weld defect inspection system in x-ray images

著者名:

Sun, Y. ( Dalian Univ. of Technology (China) )
Wang, E.L.
Zhou, P.
Li, M.

掲載資料名:

Optical information processing technology : 16-18 October 2002, Shanghai, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4929

発行年:

2002

開始ページ:

282

終了ページ:

287

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447180 [0819447188]

言語:

英語

請求記号:

P63600/4929

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012778
シリーズID:	PA00000029
会議名:	Photonics Asia : Optical Information Processing Technology
回次:	2002
会議開催地:	Shanghai, China
会議開催年:	2002.10.16-2002.10.18

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