New MCP reflection x-ray sensitive film of variable-density halide
- 著者名:
Dan, T.R. ( Changchun Univ. of Science and Technology (China) ) Tian, J.Q. Sun, X.P. Li, Y. Niu, J.B. Jiang, D.L. Duanmu, Q.D. Fu, L.C. - 掲載資料名:
- Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4919
- 発行年:
- 2002
- 開始ページ:
- 401
- 終了ページ:
- 404
- 総ページ数:
- 4
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447081 [0819447080]
- 言語:
- 英語
- 請求記号:
- P63600/4919
- 資料種別:
- 国際会議録
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SPIE-The International Society for Optical Engineering |
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SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |