Measuring system for micro radius of curvature

Measuring system for micro radius of curvature

著者名:

Narumi, T. ( Mitutoyo Corp. (Japan) )
Nakamura. T.
Ichihara, Y.
Saruki, Y.
Miyakura, J. ( MSTI Inc. (Japan) )

掲載資料名:

Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4902

発行年:

2002

開始ページ:

262

終了ページ:

269

総ページ数:

8

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446893 [0819446890]

言語:

英語

請求記号:

P63600/4902

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012751
シリーズID:	PA00000029
会議名:	Optomechatronic Technologies : Optomechatronic Systems
回次:	2002 : 3rd
会議開催地:	Stuttgart, Germany
会議開催年:	2002.11.12-2002.11.14

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