Blank Cover Image

Optical tomography using confocal fan-beam illumination and its application to LCD panel inspection

著者名:
掲載資料名:
Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4902
発行年:
2002
開始ページ:
182
終了ページ:
188
総ページ数:
7
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446893 [0819446890]
言語:
英語
請求記号:
P63600/4902
資料種別:
国際会議録

類似資料:

Kajita, D., Hiyama, I., Utsumi, U., Ishii, M., Ono, K.

SPIE - The International Society of Optical Engineering

Imoto N., Jeffers R. J., Loudon R.

Plenum Press

Shimizu,J.A.

SPIE - The International Society for Optical Engineering

T. Čižmár, P. Zemánek, M. Šiler, V. Garcés-Chávez, K. Dholakia

Society of Photo-optical Instrumentation Engineers

H. Funamizu, M. Kagawa, Y. Ishii

Society of Photo-optical Instrumentation Engineers

Gorwadkar,S., Wada,T., Shirakashi,J., Hiroshima,H., Ishii,K., Komuro,M.

SPIE-The International Society for Optical Engineering

A. Fujii, T. Suzuki, K. Shimizu, K. Yatsuda, M. Igusa

Society of Photo-optical Instrumentation Engineers

Okamoto,M., Ueda,H., Nakamura,I., Shimizu,E., Kubota,T.

SPIE-The International Society for Optical Engineering

Ho, F. C., Chu, C. -W., Lee, W.

SPIE - The International Society of Optical Engineering

Nannini, M., Nerin, P., Benech, P., Schanen, I.

SPIE-The International Society for Optical Engineering

Imoto, H., Nagamine, M., Nishi, Y.

Electrochemical Society

Joshi, A., Bangerth, W., Thompson, A. B., Sevick-Muraca, E. M.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12