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Visual inspection PC system for quality control of electronic devices

著者名:
掲載資料名:
Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4902
発行年:
2002
開始ページ:
165
終了ページ:
173
総ページ数:
9
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446893 [0819446890]
言語:
英語
請求記号:
P63600/4902
資料種別:
国際会議録

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