Nanotechnologies in semiconductor electronics
- 著者名:
Pchelyakov, O. P. ( Institute of Semiconductor Physics (Russia) ) Toropov, A. I. Popov, V. P. Latyshev, A. V. litvin, L. V. Nastaushev, Yu. V. Aseev, A. L. - 掲載資料名:
- Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4900
- 発行年:
- 2002
- 巻:
- Part One
- 開始ページ:
- 247
- 終了ページ:
- 256
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819446862 [0819446866]
- 言語:
- 英語
- 請求記号:
- P63600/4900
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers | |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
Kluwer Academic Publishers | |
5
国際会議録
Atomic Steps on a Single-Crystal Surface Studied with in situ UHV Reflection-Electron Microscopy
Kluwer Academic Publishers |
Society of Photo-optical Instrumentation Engineers |
Narosa Publishing House |
SPIE-The International Society for Optical Engineering |