Blank Cover Image

Combination rule of evidence theory based on min-max operator

著者名:
掲載資料名:
Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4898
発行年:
2003
開始ページ:
207
終了ページ:
211
総ページ数:
5
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446848 [081944684X]
言語:
英語
請求記号:
P63600/4898
資料種別:
国際会議録

類似資料:

1 国際会議録 Efficient combination rule of evidence theory

Li,B., Wang,B., Wei,J., Huang,Y., Guo,Z.

SPIE-The International Society for Optical Engineering
7 国際会議録 Evidence Theory-Based Reliability Analysis and Optimization in Engineering Design

Li Du, Hong-Zhong Huang

American Society of Mechanical Engineers
2 国際会議録 Extended Dempster-Shafer combination rules based on random set theory

Zhu, Y., Li, X.R.

SPIE - The International Society of Optical Engineering
8 国際会議録 A Dempster-Shafer evidence theory-based approach for online structural health monitoring

Y. Bao, H. Li, J. Ou

Society of Photo-optical Instrumentation Engineers
3 国際会議録 Conjunctive and disjunctive combination rules of evidence

Sun, H., Farooq, M.

SPIE - The International Society of Optical Engineering
9 国際会議録 Combination rules of evidence for situation assessment and target identification [6235-42]

Sun, H., Farooq, M.

SPIE - The International Society of Optical Engineering
4 国際会議録 Remote sensing image classification method using neural network based on generalized image

Peng, T., Li, B.

SPIE-The International Society for Optical Engineering
10 国際会議録 Feedback Ranking Method in Topic-Based Retrieval

Li, Fei, Huang, Jia Jia, Peng, Min, Cai, Rui

Trans Tech Publications
5 国際会議録 Classification of land cover from remote sensing fused image based on ICA-SVM and D-S evidence theory

M. Chen, Y. Fu, T. Sun, D. Li, Q. Qin

Society of Photo-optical Instrumentation Engineers
11 国際会議録 Higher order mode-based large negative dispersion in step-index fibers for dispersion compensation

X. Mao, B. Lv, T. Xia, J. Li, J. Peng

Society of Photo-optical Instrumentation Engineers
6 国際会議録 Combination of rule and pattern based lithography unfriendly pattern detection in OPC flow

J. H. Kang, J.-Y. Choi, Y.-A. Shim, H.-S. Lee, B. Su

Society of Photo-optical Instrumentation Engineers
12 国際会議録 Unified Bayes filtering with fuzzy and rule-based evidence

Mahler, R.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12