Application of microwave refractometer to flux profile relationships research

Application of microwave refractometer to flux profile relationships research

著者名:

Liu, C. ( Xidian Univ. (China) )
Huang, J.
Jiang, C. ( China Research Institute of Radiowave Propagation (China) )

掲載資料名:

Microwave remote sensing of the atmosphere and environment III : 24-25 October 2002, Hangzhou, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4894

発行年:

2003

開始ページ:

318

終了ページ:

322

総ページ数:

5

出版情報:

Bellingham, Wash: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446800 [0819446807]

言語:

英語

請求記号:

P63600/4894

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012743
シリーズID:	PA00000029
会議名:	Asia-Pacific Environmental Remote Sensing : Microwave remote sensing of the atmosphere and environment
回次:	2002 : 3rd
会議開催地:	Hangzhou, China
会議開催年:	2002.10.24-2002.10.25

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