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Analysis of material properties for MEMS using interferometric measurements

著者名:
  • O'Mahony, C. ( National Microelectronics Research Ctr. (Ireland) )
  • Hill, M. ( Cork Institute of Technology (Ireland) )
  • Mathewson, A. ( National Microelectronics Research Ctr. (Ireland) )
掲載資料名:
Opto-Ireland 2002: Optics and Photonics Technologies and Applications
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4876
発行年:
2003
巻:
Part Two
開始ページ:
712
終了ページ:
722
総ページ数:
11
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446572 [0819446572]
言語:
英語
請求記号:
P63600/4876
資料種別:
国際会議録

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