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SIM internal metrology beam launcher development

著者名:
Zhao, F. ( Jet Propulsion Lab.(USA) )
Diaz, R.
Kuan, G.M.
Sigrist, N.
Beregovski, Y.
Ames, L.L. ( Lockheed Martin Advanced Technology Ctr.(USA) )
Dutta, K.
さらに 2 件
掲載資料名:
Interferometry in Space
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4852
発行年:
2003
巻:
Part One
開始ページ:
370
終了ページ:
379
総ページ数:
10
出版情報:
Bellingham, WA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446312 [0819446319]
言語:
英語
請求記号:
P63600/4852
資料種別:
国際会議録

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