Quality control of VLT-UVES data

Quality control of VLT-UVES data

著者名:

Hanuschik, R. W. ( European Southern Observatory (Germany) )
Kaufer, A. ( European Southern Observatory (Chile) )
Modigliani, A. ( European Southern Observatory (Germany) )
D'Odorico, S.
Dekker, H.

掲載資料名:

Observatory operations to optimize scientific return III : 22-23 August 2002, Waikoloa, Hawaii USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4844

発行年:

2002

開始ページ:

384

終了ページ:

395

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446237 [0819446238]

言語:

英語

請求記号:

P63600/4844

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012686
シリーズID:	PA00000029
会議名:	Astronomical Telescopes and Instrumentation : Observatory operations to optimize scientific return
回次:	2002 : 3rd
会議開催地:	Waikoloa, HI, USA
会議開催年:	2002.08.22-2002.08.23

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