Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI

Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI

著者名:

Leveque, S.A. ( European Southern Observatory (Germany) )
Wilhelm, R.
Salvade, Y. ( Institute of Microtechnology/Univ. de Neuchatel (Switzerland) )
Scherler, O.
Daendliker, R.

掲載資料名:

Interferometry for Optical Astronomy II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4838

発行年:

2003

巻:

Part Two

開始ページ:

983

終了ページ:

994

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446176 [0819446173]

言語:

英語

請求記号:

P63600/4838

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012677
シリーズID:	PA00000029
会議名:	Astronomical Telescopes and Instrumentation : Interferometry for Optical Astronomy
回次:	2002 : 2nd
会議開催地:	Waikoloa, HI, USA
会議開催年:	2002.08.22-2002.08.28

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