Analysis of charge transfer efficiency noise on proton-damaged CCDs for the Hubble Space Telescope Wide Field Camera 3

Analysis of charge transfer efficiency noise on proton-damaged CCDs for the Hubble Space Telescope Wide Field Camera 3

著者名:

Johnson, S.D. ( NASA Goddard Space Flight Ctr. (USA) )
Waczynski, A.
Polidan, E.J.
Marshall, P.W.
Reed, R.A.

掲載資料名:

Photonics for space environments VIII : 9-10 July 2002, Seattle, Washington, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4823

発行年:

2002

開始ページ:

245

終了ページ:

253

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445919 [0819445916]

言語:

英語

請求記号:

P63600/4823

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012661
シリーズID:	PA00000029
会議名:	Optics & Photonics : Photonics for Space Environments
回次:	2002 : 8th
会議開催地:	Seattle, WA, USA
会議開催年:	2002.07.09-2002.07.10

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