STAIRS C: production SXGA thermal imaging

STAIRS C: production SXGA thermal imaging

著者名:

McDonald, J.P. ( Thales Optronics (United Kingdom) )

Crawford, S.

Craig, R.

Glass, A.W.

Dennis, P.N.J. ( QinetiQ (United Kingdom) )

Wells, J. ( BAE SYSTEMS (United kingdom) )

さらに 1 件

掲載資料名:

Infrared Technology and Applications XXVIII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4820

発行年:

2003

巻:

Part One

開始ページ:

469

終了ページ:

478

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445889 [0819445886]

言語:

英語

請求記号:

P63600/4820

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012657
シリーズID:	PA00000029
会議名:	Optics & Photonics : Infrared technology and applications
回次:	2002 : 28th
会議開催地:	Seattle, WA, USA
会議開催年:	2002.07.07-2002.07.11

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