Spectral responsivity measurement of uncooled IRFPA using a free-electron laser

Spectral responsivity measurement of uncooled IRFPA using a free-electron laser

著者名:

Ishikawa, T. ( Mitsubishi Electric Corp. (Japan) )
Ueno, M.
Kimata, M.
Seto, T.
Tsubouchi, N. ( Osaka Univ. (Japan) )

掲載資料名:

Infrared Technology and Applications XXVIII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4820

発行年:

2003

巻:

Part One

開始ページ:

254

終了ページ:

260

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445889 [0819445886]

言語:

英語

請求記号:

P63600/4820

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012657
シリーズID:	PA00000029
会議名:	Optics & Photonics : Infrared technology and applications
回次:	2002 : 28th
会議開催地:	Seattle, WA, USA
会議開催年:	2002.07.07-2002.07.11

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2 国際会議録 YBaCuO uncooled microbolometer IRFPA Wada,H., Sone,T., Hata,H., Nakaki,Y., Kaneda,O., Ohta,Y., Ueno,M., Kimata,M. SPIE-The International Society for Optical Engineering	8 国際会議録 PtSi Schottky-barrier infared focal plane arrays (Invited Paper) Kimata,M., Ozeki,T., Tsubouchi,N., Ito,S. SPIE-The International Society for Optical Engineering
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