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A look ahead in residual stress analysis: the strain imager at the ILL

著者名:
Bruno, G. ( Manchester Materials Science Ctr. (United Kingdom) )
Pirling, T. ( Institut Laue-Langevin (France) )
Rowe, S.
Hutt, W. ( Manchester Materials Science Ctr. (United Kingdom) )
Withers, P.J. ( Manchester Materials Science Ctr. (United Kingdom) )
Carlile, C.J. ( Institut Laue-Langevin (France) )
さらに 1 件
掲載資料名:
Advances in neutron scattering instrumentation : 7-8 July, 2002, Seattle, Washington, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4785
発行年:
2002
開始ページ:
64
終了ページ:
74
総ページ数:
11
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445520 [0819445525]
言語:
英語
請求記号:
P63600/4785
資料種別:
国際会議録

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