IR imaging of integrated circuit power transistors during operation

IR imaging of integrated circuit power transistors during operation

著者名:

Wang, H. ( Oak Ridge National Lab. (USA) )
Dinwiddie, R.B.
Maleki, H. ( Motorola Energy Systems Group (USA) )
Oglesbee, J.
Thongsouk, C.

掲載資料名:

Thermosense XXIV : 1-4 April 2002, Orlando, [Florida] USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4710

発行年:

2002

開始ページ:

80

終了ページ:

86

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444608 [081944460X]

言語:

英語

請求記号:

P63600/4710

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012545
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : International Conference on Thermal Sensing and Imaging Diagnostic Applications
回次:	2002
会議開催地:	Orlando, FL, USA
会議開催年:	2002.04.01-2002.04.04

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