Atomic force microscopy at ultrasonic frequencies (Invited Paper)
- 著者名:
Arnold, W. ( Fraunhofer Institute for Nondestructive Testing (Germany) ) Hirsekorn, S. Kopycinska, M. Rabe, U. Reinstaedtler, M. Scherer, V. - 掲載資料名:
- Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4703
- 発行年:
- 2002
- 開始ページ:
- 53
- 終了ページ:
- 64
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444516 [0819444510]
- 言語:
- 英語
- 請求記号:
- P63600/4703
- 資料種別:
- 国際会議録
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