Method of Zernike coefficients extraction for optics aberration measurement
- 著者名:
- Shiode, Y. ( Canon Inc. (Japan) )
- Okada, S.
- Takamori, H.
- Matsuda, H.
- Fujiwara, S.
- 掲載資料名:
- Optical Microlithography XV
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4691
- 発行年:
- 2002
- 巻:
- Part Two
- 開始ページ:
- 1453
- 終了ページ:
- 1464
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444370 [0819444375]
- 言語:
- 英語
- 請求記号:
- P63600/4691
- 資料種別:
- 国際会議録
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9
国際会議録
Estimation of interferogram aberration coefficients using wavelet bases and Zernike polynomials
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