Blank Cover Image

Three-level evaluation process for segmentation methods in medical imaging

著者名:
掲載資料名:
Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4684
発行年:
2002
巻:
Part One
開始ページ:
287
終了ページ:
298
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819444295 [0819444294]
言語:
英語
請求記号:
P63600/4684
資料種別:
国際会議録

類似資料:

Pohle,R., Toennies,K.D.

SPIE-The International Society for Optical Engineering

Toennies, K.D., Celler, A., Blinder, S., Moeller, T., Harrop, R.

SPIE-The International Society for Optical Engineering

Pohle, R., Behlau, T., Toennies, K.D.

SPIE-The International Society for Optical Engineering

Toennies,K.D., Derz,C.

SPIE-The International Society for Optical Engineering

Hinz, M., Pohle, R., Shin, H., Toennies, K.D.

SPIE-The International Society for Optical Engineering

Toennies,K.D., Bock,S.

SPIE-The International Society for Optical Engineering

Hinz,M., Toennies,K.D., Grohmann,M., Pohle,R.

SPIE-The International Society for Optical Engineering

Fritscher, K. D., Schubert, R.

SPIE - The International Society of Optical Engineering

Toennies,K.D., Remonda,L., Pohle,R.

SPIE - The International Society for Optical Engineering

Al-Zubi, S., Toennies, K.D., Bodammer, N., Hinrichs, H.

SPIE-The International Society for Optical Engineering

Pohle, R., Wegner, M., Rink, K., Toennies, K.D., Celler, A., Blinder, S.

SPIE - The International Society of Optical Engineering

Aurnhammer, M., Toennies, K.D.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12