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Analysis of factors affecting the light collection efficiency in CT detector: CWO+PIN diode

著者名:
Kwak, S.-W. ( Korea Advanced Institute of Science and Technology )
Kim, K.H. ( Hyun Dae Nuclear Co., Lte. (Korea) )
Kim, H.K. ( Korea Advanced Institute of Science and Technology )
Cho, G.
Ahn, S.K.
Goh, S.M. ( Chonbuk National Univ. (Korea) )
Lee, Y. ( Korea Univ. )
Park, J.B. ( Listem Corp. (Korea) )
さらに 3 件
掲載資料名:
Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4682
発行年:
2002
開始ページ:
612
終了ページ:
619
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819444271 [0819444278]
言語:
英語
請求記号:
P63600/4682
資料種別:
国際会議録

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