Proton radiation damage in high-resistivity n-type silicon CCDs
- 著者名:
Bebek, C.J. ( Lawrence Berkeley National Lab. (USA) ) Groom, D.E. Holland, S.E. Karcher, A. Kolbe, W.F. Lee, J.S. Levi, M.E. Palaio, N.P. Turko, B.T. Uslenghi, M.C. Wagner, M.T. Wang, G. - 掲載資料名:
- Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4669
- 発行年:
- 2002
- 開始ページ:
- 161
- 終了ページ:
- 171
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444097 [081944409X]
- 言語:
- 英語
- 請求記号:
- P63600/4669
- 資料種別:
- 国際会議録
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7
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Quantum efficiency characterization of LBNL CCDs: Part I. The quantum efficiency machine [6068-35]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |