Image quality assessment by expert and non-expert viewers

Image quality assessment by expert and non-expert viewers

著者名:

Heynderickx, I. E. ( Phillips Research Labs. (Netherlands) )
Bech, S. ( Bang & Olufsen Ltd. (Denmark) )

掲載資料名:

Human vision and electronic imaging VII : 21-24 January 2002, San Jose, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4662

発行年:

2002

開始ページ:

129

終了ページ:

137

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444028 [0819444022]

言語:

英語

請求記号:

P63600/4662

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012490
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Human vision and electronic imaging
回次:	2002 : 7th
会議開催地:	San Jose, CA, USA
会議開催年:	2002.01.21-2002.01.24

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